A4P Four-Point Probe Automated Resistivity Mapping System

The A4P series wafer resistivity mappers use proven industry standards to provide fast, accurate and reliable measurements of sample resistivity distribution. Offered as a 100mm, 150mm, 200mm or 300mm system, the A4P four-point probe is designed to be maintenance free and very easy to use. A variety of options are available for this system, including wide range thermal testing, custom mandrels for non-standard materials, and custom 4-point probes for almost any application.